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Delectric and pyroelectric properties of ordered CdZnTe layers grwoth by MOCVD

机译:MOCVD法生长的有序CdZnTe层的介电和热电性质

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Cd_1-xZn_xTe (0.1≤x≤0.86) layers were epitaxially deposted on (1 0 0) CdTe and on Cd_0.96Zn_0.04Te substrates by MOCVD, and some of their electriicla and otpical properties were investigated. The dielecric cosntant as a funciton of temeprautre was found to have a peak at a Curie temepratue. At this same temeprature the slope of the resistivity showed a sharp change. It was found that the laeyrs were pyroelectric. The pyroelectic coefficient varied from k2.3×10~-11 to 5.1?10~-10 C K~-1 m~-2, depending on Zn content (x) and growth conditons. It was observed that the Curie temeprature shifts in the direction of hgiher temeprautres when the Zn content of the layers increases. The observed results are consistent with the results obtained on CdZnTe moncrystals. A correlation was obserged between the pyoelectric properties of CdZnTe and valuence band splitting effect, meausred by the photoluminescne method at 77 K.
机译:通过MOCVD法在(1 0 0)CdTe和Cd_0.96Zn_0.04Te衬底上外延沉积了Cd_1-xZn_xTe(0.1≤x≤0.86)层,并研究了它们的一些电学性质和典型性质。发现作为temeprautre的功能的二元助剂在居里温度下具有峰值。在相同的温度下,电阻率的斜率显示出急剧的变化。发现层是热电的。取决于Zn含量(x)和生长条件,热电系数从k2.3×10〜-11变化到5.1×?10〜-10 C K〜-1 m〜-2。观察到,当各层的Zn含量增加时,居里温度向着高温的方向移动。观察到的结果与在CdZnTe单晶上获得的结果一致。观察到CdZnTe的压电性能与价带分裂效应之间的相关性,该效应是通过光致发光法在77 K下测量的。

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