...
首页> 外文期刊>Journal of Crystal Growth >Growth and characterizations of A1GaN/GaN heterostructures using multi-A1N buffer layers in plasma-assisted molecular beam epitaxy
【24h】

Growth and characterizations of A1GaN/GaN heterostructures using multi-A1N buffer layers in plasma-assisted molecular beam epitaxy

机译:在等离子体辅助分子束外延中使用多层AlN缓冲层生长和表征AlGaN / GaN异质结构

获取原文
获取原文并翻译 | 示例
           

摘要

A1GaN/GaN single heterostructures (SH) were grown on sapphire (0001) substrates by plasma-assisted molecular beam epitaxy. It was found that multi-A1N buffer layers are effective to improve the two-dimensional electron gas (2DEG) mobility. High 2DEG mobility of about 1200 cm~2/V s at room temperature was obtained by inserting 4 periods of A1N buffer layers. It is considered that the improvement resulted from the reduction of dislocations in the films by the multi-A1N buffer layers. It was also found that when the periods of the A1N buffer layer were 6, cracks were generated on the surface resulting in a reduction of the mobility.
机译:通过等离子辅助分子束外延在蓝宝石(0001)衬底上生长AlGaN / GaN单异质结构(SH)。已经发现,多层AlN缓冲层对于改善二维电子气(2DEG)迁移率是有效的。通过插入4个周期的AlN缓冲层,可获得室温下约1200 cm〜2 / V s的高2DEG迁移率。可以认为,这种改善是由于多层AlN缓冲层减少了薄膜中的位错。还发现,当AlN缓冲层的周期为6时,在表面上产生裂纹,导致迁移率降低。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号