The effect of x‐ray linewidth on the defocus correction in the Schulz reflection technique for texture measurement

摘要

The loss of measured intensity with increasing specimen inclination in the Schulz reflection technique for texture determination is due to the increase in the width of the diffracted beam profile with increasing inclination. This increase in width is relatively greater for a sharp rather than broad profile. Since the metallurgical condition affects the width of the profile, it also affects the defocus correction. To make an accurate texture measurement one must determine the defocus correction using a specimen of random texture which has a diffracted beamwidth similar to that of the material of interest.