Orientation-selective X-ray dark field imaging of ordered systems

摘要

X-ray scatter dark field imaging with a grating interferometer is becoming a standard tool for the characterization of microscopic texture of samples. Recently, it was shown that directional information could also be recovered when the sample displays an anisotropic ordering such as, for instance, a bundle of microscopic fibers. Here, we demonstrate that previously suggested approaches are ambiguous when multiple anisotropic orientations coexist in the sample. Therefore, we developed a new orientation-selective approach which allows for separating the contributions of individual orientations provided that these orientations are known a-priori. The method, demonstrated experimentally using a well-defined wood sample, is envisioned to be of high interest for the non-destructive inspection of composite materials.