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Dark Field Image of Full-Field Transmission Hard X-ray Microscope in 8-11 keV

机译:8-11 keV全场透射硬X射线显微镜的暗场图像

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We have demonstrated dark-field imaging using a full-field hard x-ray microscope by using a custom capillary-based condenser. The condenser provides illumination with a numeric aperture about 3-mrad with high efficiency. This high illumination angle allows full-resolution imaging using a 50 nm hard x-ray zone plate. The zeroth order beam from the condenser is well out of the zoneplate range - which allows a high signal-to-noise ratio in the image plane. Small particles with high scattering power, such as colloidal gold markers used in biology are well-suited for dark-field imaging. Combining with high brightness source from NSRRC BL01B, the dark field image can be acquired within several minutes with high contrast ratio. In this paper, the dark field image of IC and the zoneplate defect will be demonstrated and studied in different energy under dark field mode.
机译:我们已经通过使用定制的基于毛细管的聚光镜演示了使用全视野硬X射线显微镜进行的暗视野成像。聚光器可高效照明具有3毫弧度左右数值孔径的照明。这种高照明角度允许使用50 nm硬X射线分区板进行全分辨率成像。来自聚光镜的零级光束远不在区板范围内-这允许在图像平面中具有较高的信噪比。具有高散射能力的小颗粒,例如生物学中使用的胶体金标记,非常适合于暗场成像。结合NSRRC BL01B的高亮度源,可以在几分钟内以高对比度获取暗场图像。本文将在暗场模式下,以不同的能量来演示和研究IC的暗场图像和波带缺陷。

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