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机译:层转移和热退火对绝缘体内膜的性能的影响
Department of Electrical Engineering and Information Systems The University of Tokyo 7-3-1 Hongo Bunkyo-ku Tokyo Japan;
Department of Electrical Engineering and Information Systems The University of Tokyo 7-3-1 Hongo Bunkyo-ku Tokyo Japan;
Department of Electrical Engineering and Information Systems The University of Tokyo 7-3-1 Hongo Bunkyo-ku Tokyo Japan;
Department of Electrical Engineering and Information Systems The University of Tokyo 7-3-1 Hongo Bunkyo-ku Tokyo Japan;
Department of Electrical Engineering and Information Systems The University of Tokyo 7-3-1 Hongo Bunkyo-ku Tokyo Japan;
机译:基质(Si和玻璃),Cu下层,原位退火对TA / Cu的原位退火及[CO(0.3nm)/ Ni(0.6nm)] _(4,10)多层薄的磁性电影
机译:退火时间对快速热退火FePt薄膜结构和磁性的影响
机译:退火温度对通过a-Si:H薄膜快速热退火形成的多晶硅薄膜的性能的影响
机译:PA-MBE生长初始Zn层对初始Zn层的影响及ZnO薄膜的性质
机译:热退火对单层石墨烯性能的影响。
机译:快速热退火和不同氧化剂对原子层沉积LaxAlyO纳米层压膜性能的影响
机译:通过优化的热退火改善原子层沉积EU的发光性能:Y 2 O 3薄膜