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机译:原位XPS光谱研究W / Ni双层欧姆接触的热稳定性与N型4H-SIC
Department of Physics Shanghai Normal University 100 Guilin Road Shanghai 200234 China;
Department of Physics Shanghai Normal University 100 Guilin Road Shanghai 200234 China MEMS Center Harbin Institute of Technology Harbin 150001 China;
Department of Physics Shanghai Normal University 100 Guilin Road Shanghai 200234 China;
Department of Physics Shanghai Normal University 100 Guilin Road Shanghai 200234 China;
机译:基于NI型4H-SIC的NI基欧姆触点:形成机构和热稳定性
机译:在4H-SiC上同时形成n型和P型欧姆触点的热稳定性研究
机译:与N型和P型4H-SiC具有极热稳定性的Ni / W / TaSi_2 / Pt同时欧姆接触
机译:Ni和Ni / Au欧姆接触对n型4H-SiC的热稳定性
机译:研究钯/镓锑化物与N型镓锑化物的欧姆接触。
机译:在不同的注入后退火后p型铝注入的4H-SiC层上的欧姆接触
机译:基于NI的欧姆触点TON型4H-SIC:形成机构和热稳定性