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首页> 外文期刊>Journal of Applied Physics >High-temperature photocurrent mechanism of β-Ca_2O_3 based metal-semiconductor-metal solar-blind photodetectors
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High-temperature photocurrent mechanism of β-Ca_2O_3 based metal-semiconductor-metal solar-blind photodetectors

机译:β-Ca_2O_3基金属-半导体-金属日盲光电探测器的高温光电流机理

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摘要

High-temperature operation of metal-semiconductor-metal (MSM) UV photodetectors fabricated on pulsed laser deposited beta-Ga(2)O(3 )thin films has been investigated. These photodetectors were operated up to 250 degrees C temperature under 255 nm illumination. The photo to dark current ratio of about 7100 was observed at room temperature and 2.3 at a high temperature of 250 degrees C with 10 V applied bias. A decline in photocurrent was observed until a temperature of 150 degrees C beyond which it increased with temperature up to 250 degrees C. The suppression of the UV and blue band was also observed in the normalized spectral response curve above 150 degrees C temperature. Temperature-dependent rise and decay times of temporal response were analyzed to understand the associated photocurrent mechanism at high temperatures. Electronphonon interaction and self-trapped holes were found to influence the photoresponse in the devices. The obtained results are encouraging and significant for high-temperature applications of beta-Ga2O3 MSM deep UV photodetectors. Published under license by AIP Publishing.
机译:已经研究了在脉冲激光沉积的β-Ga(2)O(3)薄膜上制造的金属-半导体-金属(MSM)紫外线光电探测器的高温操作。这些光电探测器在255 nm的光照下在高达250摄氏度的温度下运行。在室温下观察到大约7100的光暗电流比,在250摄氏度的高温下施加10 V偏压时观察到2.3的光暗电流比。观察到光电流下降,直到温度达到150摄氏度为止,直到温度上升到250摄氏度为止才增加。在150摄氏度以上的温度下,归一化的光谱响应曲线中也观察到了紫外线和蓝带的抑制。分析了温度响应的时间响应的上升和下降时间,以了解高温下的相关光电流机制。发现电子声子相互作用和自陷孔会影响器件中的光响应。所获得的结果令人鼓舞,对于β-Ga2O3MSM深紫外光电探测器的高温应用也具有重要意义。由AIP Publishing授权发布。

著录项

  • 来源
    《Journal of Applied Physics 》 |2019年第14期| 144501.1-144501.7| 共7页
  • 作者单位

    Indian Inst Technol Delhi, Dept Phys, New Delhi 110016, India;

    Indian Inst Technol Delhi, Dept Phys, New Delhi 110016, India;

    Univ Delhi, Dept Phys & Astrophys, Delhi 110007, India;

    KAUST, Adv Semicond Lab, Thuwal 239556900, Saudi Arabia;

    KAUST, Adv Semicond Lab, Thuwal 239556900, Saudi Arabia;

    Univ Delhi, Dept Phys & Astrophys, Delhi 110007, India;

    KAUST, Adv Semicond Lab, Thuwal 239556900, Saudi Arabia;

    Indian Inst Technol Delhi, Dept Phys, New Delhi 110016, India;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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  • 正文语种 eng
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