Depth dependence of elastic grain interaction and mechanical stress: Analysis by x-ray diffraction measurements at fixed penetration/information depths

摘要

Gradients of the type of elastic grain interaction and the (residual) internal state of stress were determined. This was possible by the application of x-ray diffraction stress measurements at various fixed penetration/information depths. The analysis was applied to nickel films of thicknesses 2 and 4 μm. Surface anisotropy was considered as source of direction-dependent (anisotropic) elastic grain interaction. It was found that only a small gradient of the state of stress, but a pronounced gradient of the grain interaction constraints, prevails in the investigated specimens. Thereby the evidence for the depth dependence of the so-called surface anisotropy was obtained.