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首页> 外文期刊>Journal of Applied Physics >Electrical properties of (110) epitaxial lead-free ferroelectric Na_(0.5)Bi_(0.5)TiO_3 thin films grown by pulsed laser deposition: Macroscopic and nanoscale data
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Electrical properties of (110) epitaxial lead-free ferroelectric Na_(0.5)Bi_(0.5)TiO_3 thin films grown by pulsed laser deposition: Macroscopic and nanoscale data

机译:脉冲激光沉积生长的(110)外延无铅铁电Na_(0.5)Bi_(0.5)TiO_3薄膜的电学性质:宏观和纳米级数据

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摘要

We report the electrical properties, measured both at the macroscopic and nanometric scales, of epitaxial (110)-Na_(0.5)Bi_(0.5)TiO_3 (NBT) thin films grown on (110)Pt/(110)SrTiO_3 by pulsed laser deposition (PLD). The influence of the A-site composition (Na and/or Bi excess) on both the structural/microstructural characteristics and the electrical properties is discussed. Whatever the composition of the NBT target, the final layers are systematically epitaxially grown, with NBT crystallites mainly (110)-oriented, and as well (100)-oriented for some minor proportion. Atomic force microscopy (AFM) images reveal the coexistence of two kinds of grains presenting different shapes: namely flat and elongated grains, corresponding to (100)- and (110)-oriented NBT crystallites, respectively. The macroscopic ferroelectric properties were measured at room temperature. A rather well-defined shape of the hysteresis loops was obtained: the incorporation of a Bi excess in the target clearly improves the saturation of the loops. The ferroelectric performances are a remanent polarization (P_r) value, ranging from 7 to 14 μC/cm~2, associated with a coercive field (E_c) in the range 68-85 kV/cm. In addition, at 10~5 Hz, the relative permittivity was about ε_r ~ 255-410 and the dielectric losses (tan δ) were ~6%-7%. Finally, the electrical properties at the local scale were investigated by coupling piezoresponse force microscopy (PFM) and tunneling AFM (TUNA) measurements. The collected data reveal that the two types of grains behave differently. The PFM amplitude signal of (110)-oriented grains is very contrasted and such grains are often divided in ferroelectric bi-domains of nanometric sizes, whereas the response of (100)-oriented grains is less contrasted and more homogeneous. The interpretation of the PFM signal is provided. The piezoloop recorded on a (110)NBT grain is strongly distorted and shifted along the vertical axis, in agreement with the vertical drift observed for macroscopic ferroelectric data. Finally, TUNA data clearly indicate that flat grains are leakier than elongated grains, highlighting the anisotropy of the electrical properties at the local scale.
机译:我们报告了通过脉冲激光沉积在(110)Pt /(110)SrTiO_3上生长的外延(110)-Na_(0.5)Bi_(0.5)TiO_3(NBT)薄膜的宏观和纳米尺度的电学性质(PLD)。讨论了A位成分(过量的Na和/或Bi)对结构/微结构特征和电性能的影响。无论NBT靶的成分是什么,最终的层都是系统地外延生长的,NBT晶体主要是(110)取向的,还有(100)取向的比例很小。原子力显微镜(AFM)图像揭示了两种呈现不同形状的晶粒的共存:即扁平晶粒和细长晶粒,分别对应于(100)和(110)取向的NBT微晶。在室温下测量宏观铁电性能。磁滞回线的形状非常明确:在目标中掺入过量的Bi明显改善了回线的饱和度。铁电性能是剩余极化(P_r)值,范围从7到14μC/ cm〜2,与68-85 kV / cm范围内的矫顽场(E_c)相关。另外,在10〜5 Hz时,相对介电常数约为ε_r〜255-410,介电损耗(tanδ)约为6%-7%。最后,通过耦合压电响应力显微镜(PFM)和隧道AFM(TUNA)测量研究了局部尺度的电性能。收集的数据表明两种谷物的行为不同。 (110)取向晶粒的PFM振幅信号形成了鲜明的对比,此类晶粒通常被划分为纳米尺寸的铁电双畴,而(100)取向晶粒的响应则对比度较低,并且更加均匀。提供了PFM信号的解释。与宏观铁电数据所观察到的垂直漂移相一致,记录在(110)NBT晶粒上的压电环强烈变形并沿垂直轴移动。最后,TUNA数据清楚地表明,扁平晶粒比细长晶粒更易泄漏,突出了局部尺度上电学性能的各向异性。

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  • 来源
    《Journal of Applied Physics》 |2012年第10期|p.104106.1-104106.13|共13页
  • 作者单位

    Laboratoire de Sciences des Procedes Ceramiques et de Traitements de Surface, UMR 7315 CNRS, Centre Europeen de la Cframique, Universite de Limoges, 12 rue Atlantis, 87068 Limoges Cedex, France;

    Laboratoire de Sciences des Procedes Ceramiques et de Traitements de Surface, UMR 7315 CNRS, Centre Europeen de la Cframique, Universite de Limoges, 12 rue Atlantis, 87068 Limoges Cedex, France;

    Institut des Nanotechnologies de Lyon, INSA de Lyon, 7, Avenue Capelle, 69621 Villeurbanne Cedex, France;

    Laboratoire de Sciences des Procedes Ceramiques et de Traitements de Surface, UMR 7315 CNRS, Centre Europeen de la Cframique, Universite de Limoges, 12 rue Atlantis, 87068 Limoges Cedex, France;

    Department of Ceramics and Glass Engineering, Centre for Research in Ceramics and Composite Materials, Campus Universitdrio, Aveiro 3810-193, Portugal;

    Unite Sciences Chimiques de Rennes, UMR 6226 CNRS-Universiti de Rennes 1, Equipe Chimie du Solide et Matiriaux, 35042 Rennes Cedex, France;

    Unite de Dynamique et Structure des Matiriaux Moliculaires, Universite du Littoral Cote d'Opale, 40 rue Ferdinand Buisson, BP649, 62228 Calais, France;

    Laboratoire de Sciences des Procedes Ceramiques et de Traitements de Surface, UMR 7315 CNRS, Centre Europeen de la Cframique, Universite de Limoges, 12 rue Atlantis, 87068 Limoges Cedex, France;

    Institut des Nanotechnologies de Lyon, INSA de Lyon, 7, Avenue Capelle, 69621 Villeurbanne Cedex, France;

    Laboratoire de Sciences des Procedes Ceramiques et de Traitements de Surface, UMR 7315 CNRS, Centre Europeen de la Cframique, Universite de Limoges, 12 rue Atlantis, 87068 Limoges Cedex, France;

    Laboratoire de Sciences des Procedes Ceramiques et de Traitements de Surface, UMR 7315 CNRS, Centre Europeen de la Cframique, Universite de Limoges, 12 rue Atlantis, 87068 Limoges Cedex, France;

    Unite Sciences Chimiques de Rennes, UMR 6226 CNRS-Universiti de Rennes 1, Equipe Chimie du Solide et Matiriaux, 35042 Rennes Cedex, France;

    Department of Ceramics and Glass Engineering, Centre for Research in Ceramics and Composite Materials, Campus Universitdrio, Aveiro 3810-193, Portugal;

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