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Optical properties of rare-earth doped epitaxial Sr0.5Ba 0.5Nb2O6 thin films grown by pulsed laser deposition

机译:脉冲激光沉积生长稀土掺杂外延Sr0.5Ba 0.5Nb2O6薄膜的光学性质

摘要

Optical quality rare-earth (RE) (Nd3+, Eu3+, Gd 3+ and Yb3+) doped Sr0.5Ba0.5Nb 2O6 (SBN) epitaxial films of ∼ 170 nm thick have been successfully grown on MgO (100) single crystal substrates using pulsed laser deposition technique. Strong residual stress in these films has been revealed by Raman spectroscopic studies. Two kinds of in-plane orientations with respect to the MgO substrate co-exist. All the film samples show high transparency in the visible wavelength. Their band-gap energies appear to be independent of the types of dopant. Photoluminescence (PL) spectra of RE-doped SBN ceramics show a strong and broad emission band at around 600 nm (2.07 eV). The peak position of this emission band changes slightly with different RE-dopants. Thin film samples, however, yield a broad PL band at around 385 nm (3.22 eV). This UV emission shows no observable shift in the peak position for different dopants. Apart from these broad emission bands, conspicuous emission lines from Eu 3+ and Nd3+ ions are also noted. The origins of these PL spectra are discussed.
机译:掺有Sr0.5Ba0.5Nb 2O6(SBN)的光学质量稀土(Nd3 +,Eu3 +,Gd 3+和Yb3 +)厚约170 nm的Sr0.5Ba0.5Nb 2O6(SBN)外延膜已通过脉冲法在MgO(100)单晶衬底上成功生长。激光沉积技术。通过拉曼光谱研究已经揭示了这些膜中强大的残余应力。相对于MgO衬底的两种面内取向共存。所有的薄膜样品在可见光波长下都显示出高透明度。它们的带隙能量似乎与掺杂剂的类型无关。掺稀土的SBN陶瓷的光致发光(PL)光谱在600 nm(2.07 eV)处显示出很强的发射带。该发射带的峰值位置随不同的RE掺杂而略有变化。但是,薄膜样品在385 nm(3.22 eV)处产生宽的PL带。对于不同的掺杂剂,该UV发射显示出在峰位置上没有可观察到的偏移。除了这些宽的发射带外,还注意到了Eu 3+和Nd3 +离子的明显发射线。讨论了这些PL光谱的起源。

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