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机译:平面GaAs基异质结构耿氏二极管中的碰撞电离电致发光:掺杂不均匀性的空间分布和影响。
Center for Device Thermography and Reliability, H. H. Wills Physics Laboratory, University of Bristol,BS8 1TL Bristol, United Kingdom;
Department of Physics, University of Aberdeen, King's College, AB24 3UE Aberdeen, United Kingdom;
Department of Physics, University of Aberdeen, King's College, AB24 3UE Aberdeen, United Kingdom;
School of Engineering, University of Glasgow, Rankine Building, G12 8LT Glasgow, United Kingdom;
School of Engineering, University of Glasgow, Rankine Building, G12 8LT Glasgow, United Kingdom;
Department of Engineering, DeMontfort University, The Gateway, LE1 9BH Leicester, United Kingdom;
Department of Engineering, DeMontfort University, The Gateway, LE1 9BH Leicester, United Kingdom;
Center for Device Thermography and Reliability, H. H. Wills Physics Laboratory, University of Bristol,BS8 1TL Bristol, United Kingdom;
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机译:平面GaAs基异质结构耿氏二极管中的碰撞电离电致发光:空间分布和掺杂不均匀性的影响。