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首页> 外文期刊>Journal of Applied Physics >Critical switching current and thermal stability of magnetic tunnel junctions with uncompensated CoFeB/Ru/CoFeB synthetic free layers
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Critical switching current and thermal stability of magnetic tunnel junctions with uncompensated CoFeB/Ru/CoFeB synthetic free layers

机译:具有未补偿的CoFeB / Ru / CoFeB合成自由层的磁性隧道结的临界开关电流和热稳定性

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摘要

The critical switching current and thermal stability parameter are investigated for magnetic tunnel junctions with uncompensated synthetic ferrimagnetic free layers. The parameters are obtained by analyzing the experimental results for the thermally activated magnetization switching probability as functions of both a bias current and an applied magnetic field. The analysis is greatly facilitated by the use of an analytical equation for the applied magnetic field dependence of the energy barrier. A figure of merit given by the ratio of the two parameters differs substantially depending on the direction of the magnetization switching.
机译:研究了具有未补偿合成亚铁磁自由层的磁性隧道结的临界开关电流和热稳定性参数。通过分析作为偏置电流和所施加磁场的函数的热激活磁化切换概率的实验结果来获得参数。通过使用解析方程来计算势垒的磁场依赖性,可以大大简化分析过程。由两个参数的比率给出的品质因数根据磁化切换的方向而显着不同。

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  • 来源
    《Journal of Applied Physics 》 |2013年第9期| 093906.1-093906.5| 共5页
  • 作者单位

    Department of Nano Semiconductor Engineering, Korea University, Seoul 136-713, South Korea;

    Korea Institute of Science and Technology, Seoul 136-791, South Korea;

    Korea Institute of Science and Technology, Seoul 136-791, South Korea;

    Korea Institute of Science and Technology, Seoul 136-791, South Korea;

    Department of Materials Science and Engineering, Korea University, Seoul 136-713, South Korea;

    Korea Institute of Science and Technology, Seoul 136-791, South Korea Department of Materials Science and Engineering, Korea University, Seoul 136-713, South Korea;

    Department of Nano Semiconductor Engineering, Korea University, Seoul 136-713, South Korea Department of Materials Science and Engineering, Korea University, Seoul 136-713, South Korea;

    Korea Basic Science Institute, Daejeon 305-333, South Korea;

    Korea Basic Science Institute, Daejeon 305-333, South Korea;

    Singulus Technologies Ag, D-63796 Kahl am Main, Germany;

    Singulus Technologies Ag, D-63796 Kahl am Main, Germany;

    Singulus Technologies Ag, D-63796 Kahl am Main, Germany;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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  • 正文语种 eng
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