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首页> 外文期刊>Journal of Applied Physics >Improving charge injection in high-mobility rubrene crystals: From contact-limited to channel-dominated transistors
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Improving charge injection in high-mobility rubrene crystals: From contact-limited to channel-dominated transistors

机译:改善高迁移率红荧烯晶体中的电荷注入:从接触受限晶体管到沟道为主的晶体管

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摘要

With progressively improving charge carrier mobility in organic semiconductors and miniaturization of organic field-effect transistors (OFETs), low contact resistances become ever more important. To study the capabilities of metal electrodes in OFETs and to explore the transition from contact-limited to channel-dominated transistor operation, we used flip-crystal FETs with gold electrodes having different contact resistances R_c to high-quality rubrene crystals. 4-terminal transfer and output measurements reveal that R_c decreases from 10~5-10~6 Ω cm for 15 min air exposure to 3 × 10~3 Ωcm for at least 5 h air exposure of the gold electrodes before the flip-crystal FET is assembled. We conclude the reduction of R_c to be caused by a growing contamination layer on the gold electrodes that weakens the electrostatic coupling between rubrene crystal and gold electrode, and lowers the Schottky contact diode parameter V_0. In channel-dominated (low R_c) FETs, the mobility is in the range of 10-17 cm~2/(Vs); in contrast, in contact-limited (high R_c) FETs, the apparent mobility decreases significantly with increasing contact resistance. The apparent μ - R_c dependence is not intrinsic, but rather the result of incorrect assumptions of the potential and the charge carrier density in the channel region. Thus, the development of high-mobility organic semiconductors requires further efforts to improve contacts bevond traditional metal electrodes.
机译:随着有机半导体中电荷载流子迁移率的逐步提高和有机场效应晶体管(OFET)的小型化,低接触电阻变得越来越重要。为了研究OFET中金属电极的功能并探索从接触受限到沟道为主的晶体管工作的过渡,我们使用了具有金电极的倒装晶体FET,该金电极具有不同的接触电阻R_c与高质量的红荧烯晶体。 4端子传输和输出测量表明,在翻转晶体FET之前,金电极的空气暴露至少15 h后,R_c从10〜5-10〜6Ωcm降低至15×5〜3Ωcm,而金电极暴露至少3 h已组装。我们得出结论,R_c的降低是由于金电极上污染层的增加而引起的,该污染层削弱了红荧烯晶体和金电极之间的静电耦合,并降低了肖特基接触二极管的参数V_0。在以沟道为主的(低R_c)FET中,迁移率在10-17 cm〜2 /(Vs)范围内。相反,在接触受限(高R_c)的FET中,表观迁移率随接触电阻的增加而显着降低。明显的μ-R_c依赖性不是内在的,而是沟道区中电势和电荷载流子密度的错误假设的结果。因此,高迁移率有机半导体的发展需要进一步的努力来改善传统金属电极之间的接触。

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  • 来源
    《Journal of Applied Physics 》 |2014年第16期| 164511.1-164511.10| 共10页
  • 作者单位

    Laboratory for Solid State Physics, ETH Zurich, 8093 Zurich, Switzerland;

    Laboratory for Solid State Physics, ETH Zurich, 8093 Zurich, Switzerland;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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  • 正文语种 eng
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