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机译:(Ga,In)As / Ga(As,Sb)异质结构中的能带偏移
Department of Physics and Material Sciences Center, Philipps-Universitaet Marburg, Renthof 5,35032 Marburg, Germany;
Department of Physics and Material Sciences Center, Philipps-Universitaet Marburg, Renthof 5,35032 Marburg, Germany;
Department of Physics and Material Sciences Center, Philipps-Universitaet Marburg, Renthof 5,35032 Marburg, Germany;
Department of Physics and Material Sciences Center, Philipps-Universitaet Marburg, Renthof 5,35032 Marburg, Germany;
Nonlinear Control Strategies Inc, 7040 N. Montecatina Dr., Tucson, Arizona 85704, USA,College of Optical Sciences, University of Arizona, Tucson, Arizona 85721, USA;
Nonlinear Control Strategies Inc, 7040 N. Montecatina Dr., Tucson, Arizona 85704, USA,College of Optical Sciences, University of Arizona, Tucson, Arizona 85721, USA;
Department of Physics and Material Sciences Center, Philipps-Universitaet Marburg, Renthof 5,35032 Marburg, Germany;
Department of Physics and Material Sciences Center, Philipps-Universitaet Marburg, Renthof 5,35032 Marburg, Germany;
机译:金属有机化学气相沉积法生长Al_2O_3 / In_(0.15)Ga_(0.85)Sb / GaSb / GaAs异质结构的材料生长和能带偏移的确定
机译:分子束外延生长的Ⅱ型In_(0.27)Ga_(0.73)Sb / In_xAl_(1-x)As_ySb_(1-y)异质结构导带偏移的确定
机译:用于n沟道隧道场效应晶体管的混合As / Sb ll-ll交错间隙异质结构的带偏移确定
机译:II型带偏移的界面粗糙度散射归属GAINASSB / INAS单个异质结构
机译:MBE生长的砷化镓/砷化铝镓和砷化镓铟/砷化铝铟半导体异质结构中带隙的测定
机译:X射线光发射光谱法测量的非极性A面GaN / AlN和AlN / GaN异质结构的能带偏移
机译:(Ga,In)As / Ga(As,Sb)异质结构中的能带偏移
机译:具有不对称带偏移约束的alGaassb / InGaassb双异质结构中电致发光的蓝移。