首页> 外文期刊>Journal of Applied Physics >On electrode pinning and charge blocking layers in organic solar cells
【24h】

On electrode pinning and charge blocking layers in organic solar cells

机译:在有机太阳能电池的电极固定层和电荷阻挡层上

获取原文
获取原文并翻译 | 示例
获取外文期刊封面目录资料

摘要

We use device modelling for studying the losses introduced by metallic electrodes in organic solar cells' device structure. We first discuss the inclusion of pinning at the integer charge transfer state in device models, with and without using the image charge potential. In the presence of disorder, the space charge introduced due to the image potential enhances the pinning by more than 0.2 eV. The explicit introduction of the image potential creates band-gap narrowing at the contact, thus affecting both dark leakage current and photo conversion efficiency. We find that there are two regimes in which the contacts may limit the performance. For low (moderate) barriers, the contacts introduce minority carrier recombination at the contacts that adds to the bulk recombination channels. Only for high barriers, the contacts directly limit the open circuit voltage and impose a value that is equal to the contact's energy difference. Examining the device structures with blocking layers, we find that these are mainly useful for the low to moderate contacts' barriers and that for the high barrier case, the enhancement of open circuit voltage may be accompanied by the introduction of serial resistance or S shape.
机译:我们使用器件建模来研究金属电极在有机太阳能电池器件结构中引入的损耗。我们首先讨论在使用和不使用图像电荷电势的情况下,器件模型中是否包括固定在整数电荷转移状态。在无序的情况下,由于图像电势而引入的空间电荷使钉扎增强了0.2 eV以上。显式引入图像电势会在触点处产生带隙变窄,从而影响暗漏电流和光转换效率。我们发现有两种接触可能会限制性能的机制。对于低(中等)势垒,触点在触点处引入少数载流子重组,从而增加了整体重组通道。仅对于高势垒,触点会直接限制开路电压,并施加一个等于触点能量差的值。通过检查带有阻挡层的器件结构,我们发现这些阻挡层主要用于中低度接触的势垒,而对于高势垒情况,开路电压的提高可能会伴随引入串联电阻或S形。

著录项

  • 来源
    《Journal of Applied Physics》 |2017年第19期|195502.1-195502.11|共11页
  • 作者

    Osnat Magen; Nir Tessler;

  • 作者单位

    Zisapel Nano-Electronic Center, Department of Electrical Engineering, Technion - Israel Institute of Technology, Haifa 32000, Israel;

    Zisapel Nano-Electronic Center, Department of Electrical Engineering, Technion - Israel Institute of Technology, Haifa 32000, Israel;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号