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Study of magneto-electric coupling between ultra-thin Fe films and PMN-PT using X-ray magnetic circular dichroism

机译:X射线磁性圆二色性研究超薄铁膜与PMN-PT之间的磁电耦合

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摘要

X-ray absorption spectra and magnetic circular dichroism were measured at the Fe L-3,L- 2-edges of an iron wedge deposited on a ferroelectric substrate in the total electron yield mode. Upon switching the ferroelectric polarization from P-up to P-down, we observe a relative change in the total magnetic moment of 20% for 1.5 nm thin Fe. For 3 nm thin Fe, the relative change is within the sum rule error bar. Taking the sampling depth of the measurement method into account, this difference is compatible with a magnetic anisotropy change taking place in the first interfacial layer in contact with the ferroelectric substrate. We attribute this interfacial coupling to a charge accumulation or depletion at the interface. (C) 2018 Author(s).
机译:在总电子产率模式下,在沉积在铁电衬底上的铁楔的Fe L-3,L-2边缘处测量了X射线吸收光谱和磁性圆二色性。将铁电极化从P向上切换到P向下时,我们观察到1.5 nm薄铁的总磁矩有20%的相对变化。对于3 nm的薄铁,相对变化在求和规则误差线之内。考虑到测量方法的采样深度,该差异与在与铁电基板接触的第一界面层中发生的磁各向异性变化兼容。我们将此界面耦合归因于界面处的电荷累积或耗尽。 (C)2018作者。

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  • 来源
    《Journal of Applied Physics》 |2018年第6期|064103.1-064103.5|共5页
  • 作者单位

    Paul Scherrer Inst, Swiss Light Source, CH-5232 Villigen, Switzerland;

    Paul Scherrer Inst, Swiss Light Source, CH-5232 Villigen, Switzerland;

    Paul Scherrer Inst, Swiss Light Source, CH-5232 Villigen, Switzerland;

    Paul Scherrer Inst, Swiss Light Source, CH-5232 Villigen, Switzerland;

    Paul Scherrer Inst, Swiss Light Source, CH-5232 Villigen, Switzerland;

    Paul Scherrer Inst, Swiss Light Source, CH-5232 Villigen, Switzerland;

    Paul Scherrer Inst, Swiss Light Source, CH-5232 Villigen, Switzerland;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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  • 正文语种 eng
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