首页> 外文期刊>Journal of Applied Mechanics and Technical Physics >MEASURING THE TEMPERATURE AND DENSITY OF SECONDARY ELECTRONS IN AN ARGON ELECTRON-BEAM PLASMA
【24h】

MEASURING THE TEMPERATURE AND DENSITY OF SECONDARY ELECTRONS IN AN ARGON ELECTRON-BEAM PLASMA

机译:测量氩电子束等离子体中二次电子的温度和密度

获取原文
获取原文并翻译 | 示例

摘要

The results of temperature and density measurements of secondary electrons in a free jet of argon, activated in an electron beam plasma, carried out using a Langmuir double electrostatic probe. A cold plasmatron prototype with a primary beam energy of 1 keV is used obtain a jet of dense cold plasma with a cross size of approximately 80 mm and parameters with which silicon layers may be deposited with necessary characteristics in a forvacuum pressure range.
机译:使用Langmuir双静电探针在电子束等离子体中激活的氩自由射流中二次电子的温度和密度测量结果。使用主束能量为1 keV的冷等离子加速器原型,可获得密集的冷等离子体射流,其横截面约为80毫米,其参数可以在真空压力范围内沉积具有必要特性的硅层。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号