Exploring the Utility of Logistic Mixed Modeling Approaches to Simultaneously Investigate Item and Testlet DIF on Testlet-based Data

摘要

This study explored the utility of logistic mixed models for the analysis of differential item functioning when item response data were testlet-based. Decomposition of differential item functioning (DIF) into item level and testlet level for the testlet-based data was introduced to separate possible sources of DIF: (1) an item, (2) a testlet, and (3) both the item and the testlet. Simulation study was conducted to investigate the performance of several logistic mixed models as well as the Mantel-Haenszel method under the conditions, in which the item-related DIF and testlet-related DIF were present simultaneously. The results revealed that a new DIF model based on a logistic mixed model with random item effects and item covariates could capture the item-related DIF and testlet-related DIF well under certain conditions.