首页> 外文期刊>Japanese Journal of Applied Physics. Part 1, Regular Papers & Short Notes >In Situ Transmission Electron Microscope Observation of Carbon Nanotubes in Electric Fields
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In Situ Transmission Electron Microscope Observation of Carbon Nanotubes in Electric Fields

机译:碳纳米管在电场中的原位透射电子显微镜观察

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Transmission electron microscope is used to examine the movements of carbon nanotubes in electric fields. Carbon nanotubes lying along the surface of the cathode electrode start to move into alignment with the electric field vector when the field strength reaches 0.5 V/μm and become increasingly well-aligned with the vector as field strength increases. The carbon nanotubes return to their original positions when the electric field strength returns to zero. We also examine the abrupt breakdown of carbon nanotubes when the electric field is maintained at 5.5 V/μm. The corresponding breakdown emission current density is estimated as 3.4 x 10~7 A/cm~2. The distance between the nearest nanotubes standing to align with the electric field vector is approximately 2μm. This fact means that emission site density could be increased up to 3 x 10~7 points/ cm~2 (which corresponds to one tube for each 2 μm square).
机译:透射电子显微镜用于检查电场中碳纳米管的运动。当场强达到0.5 V /μm时,位于阴极表面的碳纳米管开始向与电场矢量对齐的方向移动,并随着电场强度的增加而与矢量良好对齐。当电场强度返回零时,碳纳米管返回其原始位置。当电场保持在5.5 V /μm时,我们还研究了碳纳米管的突然击穿。相应的击穿发射电流密度估计为3.4 x 10〜7 A / cm〜2。站立以与电场矢量对准的最近的纳米管之间的距离约为2μm。这个事实意味着发射位点密度可以增加到3 x 10〜7点/ cm〜2(每2μm方形对应一个管)。

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