首页> 外文期刊>Japanese Journal of Applied Physics. Part 2, Letters & Express Letters >In-Situ Observation of the Fabrication Process of a Single Shell Carbon Fullerene Nano-Contact Using Transmission Electron Microscope-Scanning Tunneling Microscope
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In-Situ Observation of the Fabrication Process of a Single Shell Carbon Fullerene Nano-Contact Using Transmission Electron Microscope-Scanning Tunneling Microscope

机译:用透射电子显微镜-扫描隧道显微镜对单壳碳富勒烯纳米触点的制备过程进行原位观察

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摘要

A single shell carbon fullerene (SSF) was fabricated from an amorphous carbon agglomerate (a-C agglomerate) suspended between two gold electrodes. As the applied bias voltage to the a-C agglomerate was increased using a transmission electron microscope-scanning tunneling microscope (TEM-STM) system, the transformation into the SSF via a glassy carbon was observed. It was found that the SSF transformation occurred above the bias voltage of 0.6 V without a prominent loss of the number of carbon atoms. The size of the SSFs ranged from C_(60) to C_(620) having I_h or I symmetry.
机译:单壳碳富勒烯(SSF)由悬浮在两个金电极之间的无定形碳附聚物(a-C附聚物)制成。随着使用透射电子显微镜-扫描隧道显微镜(TEM-STM)系统增加了向a-C团聚体施加的偏置电压,观察到了通过玻璃碳向SSF的转化。发现在0.6V的偏置电压以上发生了SSF转变,而碳原子数没有明显损失。 SSF的大小在具有I_h或I对称性的C_(60)至C_(620)的范围内。

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