机译:多模式扫描探针显微镜测量倾斜照明下硅条中光电流的空间分布
Institute of Applied Physics, University of Tsukuba, Tsukuba, Ibaraki 305-8573, Japan,Nanoelectronic Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8562, Japan;
Nanoelectronic Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8562, Japan;
Nanoelectronic Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8562, Japan;
Nanoelectronic Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8562, Japan;
Nanoelectronic Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8562, Japan;
机译:用开尔文探针力显微镜和扫描光电流显微镜测量沿硅纳米线的不均匀掺杂分布
机译:用扫描非线性介电显微镜测量的KTa_(1-x)Nb_xO_3相变温度的空间分布
机译:通过扫描近场光学显微镜将Si P-N光电二极管平面光电流空间分布研究
机译:在扫描探针显微镜中估计样品和探针的倾斜度
机译:砷化镓(001)上砷化铟高度应变外延的扫描探针显微镜研究,以及基于扫描探针的纳米级三维物体的成像和操作。
机译:扫描光电流显微镜测量复杂氧化物界面的电子能带对准
机译:数字扫描结构照明灯纸显微镜的条纹伪影减少