首页> 外国专利> Device for metalizing scanning probe tips of magnetic force microscopy, has light source directing large-area light to probe tips covered with salt solution, where deposition of metal particles is spatially limited to end region of tip

Device for metalizing scanning probe tips of magnetic force microscopy, has light source directing large-area light to probe tips covered with salt solution, where deposition of metal particles is spatially limited to end region of tip

机译:用于将磁力显微镜的扫描探针尖端金属化的装置,具有将大面积光导引至覆盖有盐溶液的探针尖端的光源,其中金属颗粒的沉积在空间上仅限于探针尖端的末端区域

摘要

The device (40) has a cantilever (42) in contact with a metal salt solution (43) i.e. gold salt solution, where the salt solution is in close contact with scanning probe tips (41), so that nanometer-dimensioned metal particles are deposited on the probe tips by metal atoms (48) present in the salt solution. A light source (45) directs a large-area light (44) having an arbitrary irradiation direction (47) to the probe tips covered with the salt solution, where the deposition of the metal particles is spatially limited to a sharp end region (51) of the tip covered with the solution. An independent claim is also included for a method for metalizing scanning probe tips.
机译:装置(40)具有与金属盐溶液(43)即金盐溶液接触的悬臂(42),其中盐溶液与扫描探针尖端(41)紧密接触,使得纳米尺寸的金属颗粒为盐溶液中存在的金属原子(48)沉积在探针尖端上。光源(45)将具有任意照射方向(47)的大面积光(44)导向覆盖有盐溶液的探针尖端,其中金属颗粒的沉积在空间上限于尖锐的末端区域(51) )的尖端覆盖有溶液。还包括用于使扫描探针尖端金属化的方法的独立权利要求。

著录项

相似文献

  • 专利
  • 外文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号