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Photoconductivity of Si films after blue multi-laser diode annealing for photosensor applications

机译:在用于光电传感器的蓝色多激光二极管退火之后,硅膜的光电导性

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The photoconductivity of Si films after blue multi-laser diode annealing (BLDA) has been investigated for photosensor applications. It was found that, as the laser power increases from 4 to 6W, the crystal structure changed from micrograins to large grains, and that the photoconductivity increases. After sintering the Si films in H_2/N_2 (4%) ambient at 450℃, a photosensitivity ratio of 94 was obtained under white light exposure of 100 mW/cm~2 for the Si film after the BLDA at 6 W owing to the reduction in the defects density in the Si films. These results suggest that BLDA is promising for photosensor applications in a multifunctional system on panels.
机译:已经研究了蓝色多激光二极管退火(BLDA)之后的Si膜的光电导性,以用于光电传感器应用。发现,随着激光功率从4W增加到6W,晶体结构从微晶粒变为大晶粒,并且光电导性增加。在450℃的H_2 / N_2(4%)环境中烧结Si膜后,由于还原作用,BLDA在6 W的条件下在100 mW / cm〜2的白光曝光下获得了94的光敏比。在硅膜中的缺陷密度。这些结果表明,BLDA在面板多功能系统中的光传感器应用前景广阔。

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  • 来源
    《Japanese journal of applied physics》 |2014年第3s1期|03CB02.1-03CB02.5|共5页
  • 作者单位

    Faculty of Engineering, University of the Ryukyus, Nishihara, Okinawa 903-0213, Japan;

    Faculty of Engineering, University of the Ryukyus, Nishihara, Okinawa 903-0213, Japan;

    Faculty of Engineering, University of the Ryukyus, Nishihara, Okinawa 903-0213, Japan;

    Faculty of Engineering, University of the Ryukyus, Nishihara, Okinawa 903-0213, Japan;

    Faculty of Engineering, University of the Ryukyus, Nishihara, Okinawa 903-0213, Japan;

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