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Effect of multiple reflow on IMC formation using various surface finishes

机译:多次回流对使用各种表面光洁度的IMC形成的影响

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In this paper, the results of a study on the effect of multiple reflow on the mechanism of intermetallic compounds (IMCs) formation of solder joints made from lead-free Sn-4Ag-0.5Cu (SAC405) on electroless nickel/electroless palladium/immersion gold (ENEP1G), electroless nickel/immersion gold (ENIG), immersion silver (ImAg) and copper surface finishes are presented. After the first reflow soldering, the well-known intermetallic Cu_6Sn_5 was observed in ImAg and Copper of surface finishes. While for ENEPIG and ENIG, mainly, (Ni,Cu)_3SNn_4 and (Cu,Ni)_6Sn_5 was formed respectively. By increasing the number of reflows up to three, the thickness of intermetallics increased gradually and their grain sizes coarsened. The intermetallics growth kinetics showed that the interfacial phase Cu_6Sn_5, (Ni,Cu)_3Sn_4 and (Cu,Ni)_6Sn_5 was controlled mainly by grain boundary diffusion and that the intermetallic growth on ENEPIG was found to be slowest among other surface finishes being used.
机译:本文研究了多次回流对无铅Sn-4Ag-0.5Cu(SAC405)制成的化学接头在化学镍/化学钯/浸镀中金属间化合物(IMC)形成机理的影响的结果介绍了金(ENEP1G),化学镍/浸金(ENIG),浸银(ImAg)和铜表面处理。第一次回流焊接后,在表面处理的ImAg和铜中观察到了众所周知的金属间化合物Cu_6Sn_5。而对于ENEPIG和ENIG,主要分别形成了(Ni,Cu)_3SNn_4和(Cu,Ni)_6Sn_5。通过将回流次数增加到三次,金属间化合物的厚度逐渐增加,并且晶粒尺寸变粗。金属间化合物的生长动力学表明,界面相Cu_6Sn_5,(Ni,Cu)_3Sn_4和(Cu,Ni)_6Sn_5主要受晶界扩散的控制,并且发现在ENEPIG上金属间化合物的生长最慢。

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