CONCURRENT BIST SYNTHESIS AND TEST SCHEDULING USING GENETIC ALGORITHMS

摘要

This paper presents an efficient method for concurrent built-in self-test synthesis and test scheduling in high-level synthesis. The method maximizes concurrent testing of modules while performing the allocation of functional units, test registers, and interconnects. The method is based on a genetic algorithm that efficiently explores the testable design space and finds a sub-optimal test registers assignment for each κ-test session. The method was implemented using C++ on a Linux workstation. Several benchmark examples have been implemented and favorable design comparisons are reported.