Design of a New Microcontroller-Based Vernier Fringe Counter for Interferometric Measurement of Laser Wavelength

摘要

This paper presents a new electronic Vernier fringe counter for the wavelength measurement of a diode laser in a scanning interferometer. The system is intended to be a low cost alternative to commercial systems used for gauge block calibration. The counter stage and phase coincidence detector are made with a microcontroller and high-speed CMOS logic to achieve the required resolution. The microcontroller also can synchronize with other elements to make a fully automated measurement system. This electronic design improves the resolution of the electronic counters in the previous designs.