A single-load microcalorimetric technique with newly designed X-band load for precise measurement of microwave power

摘要

This paper describes a newly designed X-band calorimetrie load of high efficiency, greater than 99.9 percent, and the single-load microcalorimetric technique for precise measurement of microwave power. Because of the thin absorbing film used in the load, it is shown that the behavior of load with alternate application of dc and microwave power is almost identical. The results of microwave power measurements by the single-load microcalorimetric technique at 10.0 and 12.0 GHz, and their agreement with the power measured using thin-film barretter mounts, developed earlier, are given. The total uncertainty in power measurement is ±0.17 percent.