Sinewave parameter estimation algorithm with application to waveform digitizer effective bits measurement

摘要

The authors present a high-performance (i.e. high-precision and high-speed) algorithm to estimate the four parameters of a sine wave from a sampled data record. The estimation errors are derived in closed form, and hence, controllable. The authors then propose a method to measure a digitizers effective bits based on this algorithm. Simulation results indicate that the proposed method gives excellent estimates of the true resolution of the simulated ideal digitizer. This proposed algorithm is noniterative and gives swift and consistent results.