Binary versus decade inductive voltage divider comparison and error decomposition

摘要

An automatic inductive voltage divider (IVD) characterization method that can measure linearity by comparing IVD's with different structures is suggested. Structural models are employed to decompose an error vector into components that represent each divider. Initial tests at 400 Hz show that it is possible to assign independent errors due to the binary and decade structures with a 2/spl sigma/ uncertainty of 0.05 parts per million (ppm) at the measured ratio values.