Testing for the Programming Circuit of SRAM-Based FPGAs

摘要

The programming circuit of SRAM-based FP- GAs consists of two shift registers, a control circuit and a config- uration memory (SRAM) cell array. Because the configuration memory cell array can be easily tested by conventional test meth- ods for RAMs, we focus on testing for the shift registers. We first derive test procedures for the shift registers, which can be done by using only the faculties of the programming circuit, without using additional hardware. Next, we show the validness of the test procedures. Finally, we show an application of the test pro- cedures to test Xilinx XC4025.