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Surface-micromachined pyroelectric infrared imaging array withvertically integrated signal processing circuitry

机译:具有垂直集成信号处理电路的表面微加工热释电红外成像阵列

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Surface-micromachining techniques have been used in thenfabrication of a 64×64 element PbTiO3 pyroelectricninfrared imager. Polysilicon microbridges of 1.2 Μm-thickness havenbeen formed 0.8 Μm above the surface of a silicon wafer. Each of then4096 polysilicon microbridges measures 50×50 Μm2 andnforms a low thermal mass support for a 30×30 Μm2nPbTiO3 pyroelectric capacitor with a thickness of 0.36 Μm.nThe air-bridge formed reduces the thermal conduction path between thendetector element and substrate. An NMOS preamplifier cell is locatedndirectly beneath each microbridge element. The measured blackbodynvoltage responsivity at 30 Hz is 1.2×104 V/W. Thencorresponding measured normalized detectivity (unamplified) D* isn2×108 cm-Hz1/2W at 30 Hz. The test chipnfabricated measures 1×1 cm2 and contains more than tennthousand transistors and 4096 micromechanical structures with integratednferroelectric microsensors. The technique of stacking of microsensorsnand integrated circuits represents a new approach for achievingnhigh-density and high-performance integrated pyroelectric microsensorsnthrough minimization of circuit to sensor interconnection with extremelynsmall thermal crosstalk
机译:表面微机械加工技术已用于制造64×64元素的PbTiO3热释电红外成像仪。厚度为1.2微米的多晶硅微桥尚未在硅片表面上方形成0.8微米。随后的4096个多晶硅微桥中的每个微桥的尺寸均为50×50μm2,并为厚度为0.36μm的30×30μm2nPbTiO3热释电电容器形成了低热质量支撑。 NMOS前置放大器单元直接位于每个微桥元件的下方。在30 Hz下测得的黑体电压响应率为1.2×104 V / W。然后在30 Hz时对应的测量归一化检测灵敏度(未放大)D *为2×108 cm-Hz1 / 2W。测试芯片的制造尺寸为1×1 cm2,包含一万多个晶体管和4096个带有集成铁电微传感器的微机械结构。微传感器和集成电路的堆叠技术代表了一种新方法,可通过最小化电路与传感器的互连以及极小的热串扰来实现高密度和高性能的集成热释电微传感器

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