...
首页> 外文期刊>IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control >Safety Assessment of Advanced Imaging Sequences II: Simulations
【24h】

Safety Assessment of Advanced Imaging Sequences II: Simulations

机译:高级成像序列的安全性评估II:模拟

获取原文
获取原文并翻译 | 示例
   

获取外文期刊封面封底 >>

       

摘要

An automatic approach for simulating the emitted pressure, intensity, and mechanical index (MI) of advanced ultrasound imaging sequences is presented. It is based on a linear simulation of pressure fields using Field II, and it is hypothesized that linear simulation can attain the needed accuracy for predicting MI and as required by FDA. The method is performed on four different imaging schemes and compared to measurements conducted using the SARUS experimental scanner. The sequences include focused emissions with an -number of 2 with 64 elements that generate highly nonlinear fields. The simulation time is between 0.67 and 2.8 ms per emission and imaging point, making it possible to simulate even complex emission sequences in less than 1 s for a single spatial position. The linear simulations yield a relative accuracy on MI between and 52.3% and for between and 62.6%, when using the impulse response of the probe estimated from an independent measurement. The accuracy is increased to between and 24.5% for MI and between and 27.0% for , when using the pressure response measured at a single point to scale the simulation. The spatial distribution of MI and closely matches that for the measurement, and simulation- can, therefore, be used to select the region for measuring the intensities, resulting in a significant reduction in measurement time. It can validate emission sequences by showing symmetry of emitted pressure fields, focal position, and intensity distribution.
机译:提出了一种模拟高级超声成像序列发射压力,强度和机械指数(MI)的自动方法。它基于使用Field II进行的压力场线性模拟,并且假设线性模拟可以达到预测MI所需的精度,并且符合FDA的要求。该方法在四种不同的成像方案上执行,并与使用SARUS实验扫描仪进行的测量结果进行了比较。序列包括数量为2的聚焦发射,其中64个元素生成高度非线性的场。每个发射和成像点的仿真时间在0.67到2.8毫秒之间,对于单个空间位置,甚至可以在不到1秒的时间内模拟甚至复杂的发射序列。当使用根据独立测量估算的探头的脉冲响应时,线性仿真得出的相对精度在MI到52.3%之间,对于MI到62.6%之间。当使用在单个点上测量的压力响应来缩放模拟时,MI的精度提高到24.5%之间,MI的精度提高到27.0%之间。 MI的空间分布与测量的空间分布紧密匹配,因此可以使用模拟来选择强度测量区域,从而显着减少测量时间。它可以通过显示发射压力场,焦点位置和强度分布的对称性来验证发射序列。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号