...
首页> 外文期刊>IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control >Characterization of Kerfless Linear Arrays Based on PZT Thick Film
【24h】

Characterization of Kerfless Linear Arrays Based on PZT Thick Film

机译:基于PZT厚膜的无K线性阵列的表征

获取原文
获取原文并翻译 | 示例
   

获取外文期刊封面封底 >>

       

摘要

Multielement transducers enabling novel cost-effective fabrication of imaging arrays for medical applications have been presented earlier. Due to the favorable low lateral coupling of the screen-printed PZT, the elements can be defined by the top electrode pattern only, leading to a kerfless design with low crosstalk between the elements. The thick-film-based linear arrays have proved to be compatible with a commercial ultrasonic scanner and to support linear array beamforming as well as phased array beamforming. The main objective of the presented work is to investigate the performance of the devices at the transducer level by extensive measurements of the test structures. The arrays have been characterized by several different measurement techniques. First, electrical impedance measurements on several elements in air and liquid have been conducted in order to support material parameter identification using the Krimholtz-Leedom-Matthaei model. It has been found that electromechanical coupling is at the level of 35%. The arrays have also been characterized by a pulse-echo system. The measured sensitivity is around -60 dB, and the fractional bandwidth is close to 60%, while the center frequency is about 12 MHz over the whole array. Finally, laser interferometry measurements have been conducted indicating very good displacement level as well as pressure. The in-depth characterization of the array structure has given insight into the performance parameters for the array based on PZT thick film, and the obtained information will be used to optimize the key parameters for the next generation of cost-effective arrays based on piezoelectric thick film.
机译:早先已经提出了多元素换能器,该换能器使得能够以新颖的成本有效的方式制造用于医疗应用的成像阵列。由于丝网印刷的PZT有利于低横向耦合,因此只能通过顶部电极图案来定义元件,从而导致无节距设计,且元件之间的串扰低。事实证明,基于厚膜的线性阵列与商用超声扫描仪兼容,并支持线性阵列波束形成以及相控阵波束形成。提出的工作的主要目的是通过对测试结构的广泛测量来研究设备在换能器级别的性能。通过几种不同的测量技术对阵列进行了表征。首先,已经对空气和液体中的几种元素进行了电阻抗测量,以支持使用Krimholtz-Leedom-Matthaei模型进行材料参数识别。已经发现,机电耦合处于35%的水平。该阵列还具有脉冲回波系统的特征。测得的灵敏度约为-60 dB,分数带宽接近60%,而整个阵列的中心频率约为12 MHz。最后,已经进行了激光干涉测量,表明位移水平和压力都非常好。阵列结构的深入表征使人们深入了解了基于PZT厚膜的阵列的性能参数,获得的信息将用于优化下一代基于压电厚膜的经济有效阵列的关键参数。电影。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号