首页> 外文期刊>Reliability, IEEE Transactions on >Reliability Programs and the Problem of Attaining High Probabilities of Mission Success in Space Exploration
【24h】

Reliability Programs and the Problem of Attaining High Probabilities of Mission Success in Space Exploration

机译:太空探索中的可靠性程序和任务成功的高概率问题

获取原文
获取原文并翻译 | 示例
           

摘要

The major obstacles to attaining high probabilities of mission success in future space exploration are described to be as follows: dependence on large numbers of propulsive stages in a given vehicle development of relatively many more long-lived components and subsystems than has been possible to achieve to date heed to improve the development process so that a reletively much ower volume of ground and flight testing is needed than formerly to provide confidence in system reliability and fragmentation of responsibilities for flight tests and for technical direction of major programs. Moreover, it is suggested that several aspects of current approach to ``reliability'' might be doing more harm than good, It is then argued that Broader and more uninhibited discussion of difficulties to attainment of high probabilities of mission success is much needed, as well as more widespread, systematic, and intense search for posible failure modes at the system, subsystem, component, and part levels; 3) general persuasion that when reduction in funds occur, that the must largely go into stretching out schedules and not into reducing the volume of ground and flight testing; integrity of communication throughout the mtitiplicity of participating elements and the conviction that, reliability engineering is an inseparable integral aspect of systems engineering.
机译:在未来的太空探索中,获得高成功率的主要障碍描述如下:在给定的车辆开发中,依赖大量的推进阶段,其相对较长的部件和子系统的寿命远远超过了实现这些目标的可能性。迄今为止,人们一直在注意改进开发过程,因此需要比以前多得多的地面和飞行测试量,才能对系统可靠性和飞行测试以及主要程序的技术指导职责分散提供信心。此外,有人建议,目前的``可靠性''方法的几个方面可能弊大于利,然后有人认为,对于获得任务成功的高概率的困难,需要进行更广泛,更广泛的讨论,因为以及在系统,子系统,组件和零件级别上更广泛,系统和深入地寻找可能的故障模式; 3)一般说服,当资金减少时,必须在很大程度上延长时间表,而不是减少地面和飞行测试的数量;整个参与元素的全过程中通信的完整性,以及人们认为可靠性工程是系统工程不可分割的组成部分。

著录项

  • 来源
    《Reliability, IEEE Transactions on》 |1964年第2期|共4页
  • 作者

    Golovin Nicholas E.;

  • 作者单位

    Office of Science and Technology, Executive Office Building Washington, D. C.;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号