Common-mode failures in redundant VLSI systems: a survey

摘要

This paper presents a survey of CMF (common-mode failures) innredundant systems with emphasis on VLSI (very large scale integration)nsystems. The paper discusses CMF in redundant systems, their possiblencauses, and techniques to analyze reliability of redundant systems innthe presence of CMF. Current practice and results on the use of designndiversity techniques for CMF are reviewed. By revisiting the CMF problemnin the context of VLSI systems, this paper augments earlier surveys onnCMF in nuclear and power-supply systems. The need for quantifiablenmetrics and effective models for CMF in VLSI systems is re-emphasized.nThese metrics and models are extremely useful in designing reliablensystems. For example, using these metrics and models, system designersnand synthesis tools can incorporate diversity in redundant systems tonmaximize protection against CMf