An analysis and experimental approach to MOS controlled diodes behavior

摘要

The metal oxide semiconductor (MOS)-controlled diode (MCD) is a new class of power semiconductor diode that can achieve ideal diode performance. In this paper, experimental verification of the MCD key concept is presented for the first time by using commercially available power metal oxide semiconductor field effect transistors (MOSFETs) operating as MCDs. Measurements of the reverse recovery currents and reverse recovery charges of these "MCDs" are obtained and compared with the body diodes of the MOSFETs. These measurements suggest that MCDs can reduce the reverse recovery current, storage charge, and switching loss significantly. Optimized MCD performances at 1.2 kV, 2.4 kV, and 4.5 kV are also predicted based on numerical simulations. Ideal performance of the MCD close to that predicted by the device simulation should be obtained once an optimized MCD is developed.