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Experimental and Theoretical Evaluation of a High Resolution CMOS Based Detector Under X-Ray Imaging Conditions

机译:X射线成像条件下基于高分辨率CMOS探测器的实验和理论评估

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Fundamental imaging performance in terms of Modulation Transfer Function (MTF), Noise Power Spectrum (NPS) and Detective Quantum Efficiency (DQE) was investigated for a high resolution CMOS based imaging sensor. The device consists of a 33.91 ${rm mg}/{rm cm}^{2}~{rm Gd}_{2} {rm O} _{2} {rm S}$:Tb scintillator screen, placed in direct contact with a CMOS photodiode array. The CMOS photodiode array, featuring 1200$,times,$ 1600 pixels with a pixel pitch of 22.5 $mu {rm m} $, was used as an optical photon detector. In addition to the conventional frequency dependent parameters characterizing image quality, image information content was assessed through the application of information capacity (IC). The MTF was measured using the slanted-edge method to avoid aliasing while the Normalized NPS (NNPS) was determined by two-dimensional (2D) Fourier transforming of uniformly exposed images. Both measurements were performed under the representative radiation quality (RQA) settings, RQA-5 (70 kVp digital-radiography) and RQA-M2 (28 kVp digital-mammography) recommended by the International Electrotechnical Commission Reports 62220-1 and 62220-1-2 respectively. The DQE was assessed from the measured MTF, NPS and the direct entrance surface air-Kerma (ESAK) obtained from X-ray spectra measurement with a portable cadmium telluride (CdTe) detector. The ESAK values ranged between 11–87 $mu{rm Gy}$ for RQA-5 and 6–40 $mu{rm Gy}$ for RQA-M2. Additionally the output electrons per X-ray photon of the detector and its signal transfer characteristics were assessed via an analytical model, within the framework of the linear cascaded s-n-nystems (LCS) theory. It was found that the detector response function was linear for the exposure ranges under investigation. Additionally our results showed that for the same RQA quality the output electrons per X-ray photon, as well as the measured and analytically predicted MTF, were not significantly affected by ESAK. MTF and DQE where found better compared to previously published data for other CCD and CMOS sensors, while the NNPS appeared to be comparable in the frequency range under investigation (0–10 cycles/mm).
机译:对于基于高分辨率CMOS的成像传感器,研究了基于调制传递函数(MTF),噪声功率谱(NPS)和检测量子效率(DQE)的基本成像性能。该设备由33.91美元{rm mg} / {rm cm} ^ {2}〜{rm Gd} _ {2} {rm O} _ {2} {rm S} $:Tb闪烁器屏幕组成,直接放置与CMOS光电二极管阵列接触。 CMOS光电二极管阵列被用作光学光子检测器,该阵列具有1200×1600像素的像素,像素间距为22.5μm。除了表征图像质量的常规频率相关参数外,还通过应用信息容量(IC)来评估图像信息内容。使用倾斜边缘方法测量MTF以避免混叠,而归一化NPS(NNPS)是通过对均匀曝光的图像进行二维(2D)傅里叶变换来确定的。两种测量均在国际电工委员会报告62220-1和62220-1-2建议的代表性辐射质量(RQA)设置,RQA-5(70 kVp数字射线照相)和RQA-M2(28 kVp数字乳腺照相)下进行。 2个。 DQE是根据测得的MTF,NPS和直接入射表面空气比释动能(ESAK)评估的,该比值由便携式碲化镉(CdTe)检测器的X射线光谱测量获得。对于RQA-5,ESAK值介于11–87 $ mu {rm Gy} $和对于RQA-M2为6–40 $ mu {rm Gy} $。另外,在线性级联的s-n-nystems(LCS)理论的框架内,通过分析模型评估了探测器的每个X射线光子的输出电子及其信号传输特性。发现在所研究的曝光范围内,检测器响应函数是线性的。此外,我们的结果表明,对于相同的RQA质量,每个X射线光子的输出电子以及经测量和分析预测的MTF均不会受到ESAK的明显影响。与先前发布的其他CCD和CMOS传感器数据相比,MTF和DQE更好,而NNPS在所研究的频率范围(0-10个循环/毫米)中似乎具有可比性。

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