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首页> 外文期刊>Nanotechnology, IEEE Transactions on >Quantum Threshold Voltage Modeling of Short Channel Quad Gate Silicon Nanowire Transistor
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Quantum Threshold Voltage Modeling of Short Channel Quad Gate Silicon Nanowire Transistor

机译:短沟道四栅极硅纳米线晶体管的量子阈值电压建模

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摘要

In this paper, a physically based analytical quantum linear threshold voltage model for short channel quad gate MOSFETs is developed. The proposed model, which is suitable for circuit simulation, is based on the analytical solution of 3-D Poisson and 2-D Schrödinger equation. Proposed model is fully validated against the professional numerical device simulator for a wide range of device geometries and also used to analyze the effect of geometry variation on the threshold voltage.
机译:本文针对短通道四栅极MOSFET建立了基于物理的解析量子线性阈值电压模型。所提出的模型适用于电路仿真,它基于3-D Poisson和2-DSchrödinger方程的解析解。所建议的模型已针对专业的数字器件仿真器针对各种器件几何结构进行了全面验证,并且还用于分析几何结构变化对阈值电压的影响。

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