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CMOS Broadband Programmable Gain Active Balun With 0.5-dB Gain Steps

机译:具有0.5dB增益步长的CMOS宽带可编程增益有源巴伦

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This paper presents a CMOS broadband programmable gain active balun (PGAB) that demonstrates seven digitally controlled gains with 0.5-dB gain steps separately for plus and minus output ports. The PGAB was designed and fabricated in a 130-nm RFCMOS process. For the maximum gain state, the measured gains of the plus and minus ports are 0.0 and 1.1 dB at 2 GHz. The operating frequency range is from 1.0 to 8.0 GHz by 0.3-dB gain step error, and it is from 1 to 13.0 GHz by 3-dB gain attenuation. For the maximum gain state, the measured amplitude imbalance and phase imbalance from 1 to 16 GHz are less than 1.4 dB and 4.1, respectively. The measured input return losses are better than 13.5 dB, and the output return losses are better than 18.5 dB for all controlled gain states from 1 to 16 GHz. The measured IP1dB at 7 GHz is 6.1 dBm. The measured noise figures for the plus and minus ports from 2 to 14 GHz are less than 11.2 and 10.2 dB, respectively. The supply voltages are 3.0 and 1.5 V, and the measured power consumption is 93 mW. The core area of the fabricated integrated circuit is 0.38 mm0.36 mm.
机译:本文介绍了一种CMOS宽带可编程增益有源巴伦(PGAB),该器件演示了正负输出端口分别具有0.5dB增益步长的七个数字控制增益。 PGAB是在130 nm RFCMOS工艺中设计和制造的。对于最大增益状态,在2 GHz下,正负端口的测量增益分别为0.0和1.1 dB。工作频率范围为1.0至8.0 GHz,具有0.3dB的增益阶跃误差,范围为1至13.0 GHz,具有3dB的增益衰减。对于最大增益状态,在1至16 GHz范围内测得的幅度不平衡和相位不平衡分别小于1.4 dB和4.1。对于1至16 GHz的所有受控增益状态,测得的输入回波损耗均优于13.5 dB,输出回波损耗均优于18.5 dB。在7 GHz处测得的IP1dB为6.1 dBm。正负端口在2至14 GHz范围内测得的噪声系数分别小于11.2和10.2 dB。电源电压为3.0和1.5 V,测得的功耗为93 mW。所制造的集成电路的核心面积为0.38mm×0.36mm。

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