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Dependence of read/write operations on uniaxial anisotropy constant in Bloch line memories

机译:读/写操作对Bloch行存储器中单轴各向异性常数的依赖性

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Characteristics of read/write (R/W) operations in Bloch line (BL) memory test structures have been investigated in order to find out which material characteristics of the magnetic garnet film have influence on the R/W margins. Two types of magnetic garnet films were investigated: one type has wide R/W margins, and the other has narrow R/W margins. The uniaxial anisotropy constant (Ku) of the magnetic garnet film with the wide R/W margins is twice as large as that of the film with the narrow R/W margins. It has been found that the stripe domain is easy to chop, and horizontal Bloch lines (HBLs) are easy to nucleate in the magnetic garnet film with the narrow R/W margins. It is thought that these phenomena come from the ease of the domain wall motion. Since the domain wall tends to move easily for small values of Ku, resulting in relatively easy domain chopping and HBL nucleation, the implication is that Ku should be increased in order to obtain wide R/W margins.
机译:为了找出磁性石榴石薄膜的哪些材料特性对R / W余量有影响,已经研究了Bloch线(BL)存储器测试结构中的读/写(R / W)操作的特性。研究了两种类型的磁性石榴石薄膜:一种具有宽的R / W余量,另一种具有窄的R / W余量。具有宽R / W裕度的磁性石榴石膜的单轴各向异性常数(Ku)是具有窄R / W裕度的磁性石榴石膜的单轴各向异性常数的两倍。已经发现,条纹磁畴易于斩断,并且水平的Bloch线(HBL)易于在具有窄的R / W余量的磁性石榴石膜中成核。认为这些现象来自于畴壁运动的容易性。由于对于Ku的较小值,畴壁趋于容易移动,从而导致相对容易的畴斩波和HBL成核,这意味着必须增加Ku以获得宽的R / W余量。

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