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Characteristics of Bloch line memory read operation in 2 mu m bubble material

机译:2微米气泡材料中Bloch行存储器读取操作的特性

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The read operation performance in Block line memory has been studied using a typical 2- mu m bubble material. A reasonable operation margin for chopping detection of a vertical Block line was obtained with a hair-pin-type chopping conductor with a 4- mu m pattern width and 1.5- mu m pattern gap. The chopping current margin and the bias-field margin are 146 mA+or-4.1%, and 107 Oe+or-6.1%, respectively. Domain-wall configurations during the chopping process have been studied numerically and compared with experimental results. Simulation results suggest that operation performance degradation can be ascribed to horizontal Bloch line nucleation during the chopping process.
机译:已经使用典型的2微米气泡材料研究了块行存储器中的读取操作性能。使用具有4微米图形宽度和1.5微米图形间隙的发夹型斩波导体可获得用于斩波检测垂直块线的合理操作余量。斩波电流裕度和偏置场裕度分别为146 mA +或-4.1%和107 Oe +或-6.1%。已经对斩波过程中的畴壁构型进行了数值研究,并与实验结果进行了比较。仿真结果表明,在斩波过程中,操作性能下降可能归因于水平Bloch线成核。

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