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首页> 外文期刊>Magnetics, IEEE Transactions on >High-Speed Shielding Current Analysis in High-Temperature Superconducting Film With Cracks
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High-Speed Shielding Current Analysis in High-Temperature Superconducting Film With Cracks

机译:带有裂纹的高温超导薄膜的高速屏蔽电流分析

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摘要

Two types of numerical methods are proposed for calculating the shielding current density in a high-temperature superconducting (HTS) film containing cracks: differential algebraic equation (DAE) method and virtual-voltage method. A numerical code is developed on the basis of both methods and, by using the code, the performance of both methods is numerically investigated. The results of computations show that, if GMRES is implemented as a linear-system solver, the virtual-voltage method is much faster than the DAE method. In addition, the applicability of the -matrix method to speedup of the virtual-voltage method is numerically accessed. Consequently, it is found that the acceleration by the -matrix method is effective especially for a large-sized shielding current analysis in a high-aspect-ratio HTS film.
机译:提出了两种用于计算含裂纹的高温超导(HTS)膜中屏蔽电流密度的数值方法:微分代数方程(DAE)方法和虚拟电压方法。在这两种方法的基础上开发了一种数字代码,并通过使用该代码对两种方法的性能进行了数值研究。计算结果表明,如果将GMRES实现为线性系统求解器,则虚拟电压方法比DAE方法要快得多。另外,在数值上访问了-矩阵方法对加速虚拟电压方法的适用性。因此,发现通过-矩阵法的加速对于在高纵横比的HTS膜中的大尺寸屏蔽电流分析特别有效。

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