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High-Speed Shielding Current Analysis in High-Temperature Superconducting Film with Cracks

机译:高温超导薄膜高速屏蔽电流分析,具有裂缝

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A fast and stable method is proposed for calculating the shielding current density in a high-temperature superconducting film containing cracks. After discretized with the finite element method, the initial-boundary-value problem of the shielding current density reduces to semi-explicit differential algebraic equations (DAEs). Although the DAEs can be solved with standard ordinary-differential-equation (ODE) solvers, much CPU time is required for its numerical solution. In order to shorten the CPU time, a high-speed method is proposed. In the method, the block LU decomposition is incorporated into function evaluations in ODE solvers. A numerical code is developed on the basis of the proposed method and, as an application of the code, detectability of cracks by the scanning permanent-magnet method is numerically investigated.
机译:提出了一种快速稳定的方法,用于计算含有裂纹的高温超导膜中的屏蔽电流密度。在用有限元方法离散化之后,屏蔽电流密度的初始边界值问题减小到半显式差分代数方程(DAE)。尽管DAE可以用标准常规方程(ODE)求解器来解决,但其数值解决方案需要大量CPU时间。为了缩短CPU时间,提出了一种高速方法。在该方法中,块LU分解被掺入颂歌溶剂中的功能评估中。基于所提出的方法开发数值代码,作为代码的应用,通过扫描永磁方法的裂缝的可检测性进行了数值研究。

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