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Dynamic Thermomagnetic Writing in Tunnel Junction Cells Incorporating Two GeSbTe Thermal Barriers

机译:结合两个GeSbTe热障的隧道结单元中的动态热磁写入

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Magnetic tunnel junctions (MTJs) incorporating GeSbTe thermal barriers and weakly pinned free layers$(hbox H_ exsim 60hbox Oe)$have been produced with areas between 1$,times,$1$mu$m$^2$and 3$,times,$8$mu$m$^2$. Current pulses lasting from 100$mu$s down to 20 ns were used to heat the MTJs and reverse the free layer pinning field. It is demonstrated that pulses with 7 mW/$mu$m$^2$can be used to switch the free layer of MTJs incorporating GeSbTe (20 mW/$mu$m$^2$without GeSbTe). The dependence of the power required to switch the MTJs is studied with respect to sample area, pulse duration, and GeSbTe thickness.
机译:结合了GeSbTe隔热层和弱固定自由层的磁性隧道结(MTJ),其面积在1 $次,$ 1 $ mu $ m $ ^ 2 $和3 $次之间, $ 8 $ mu $ m $ ^ 2 $。持续100μs至20 ns的电流脉冲用于加热MTJ并反转自由层钉扎场。已证明具有7 mW /μm·m $ ^ 2 $的脉冲可用于切换掺有GeSbTe的MTJ的自由层(不含GeSbTe的20 mW /μm·m ^ 2)。相对于样品面积,脉冲持续时间和GeSbTe厚度,研究了切换MTJ所需功率的依赖性。

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