首页> 外文期刊>Information Forensics and Security, IEEE Transactions on >Using Statistical Image Model for JPEG Steganography: Uniform Embedding Revisited
【24h】

Using Statistical Image Model for JPEG Steganography: Uniform Embedding Revisited

机译:将统计图像模型用于JPEG隐写术:重新研究均匀嵌入

获取原文
获取原文并翻译 | 示例
           

摘要

Uniform embedding was first introduced in 2012 for non-side-informed JPEG steganography, and then extended to the side-informed JPEG steganography in 2014. The idea behind uniform embedding is that, by uniformly spreading the embedding modifications to the quantized discrete cosine transform (DCT) coefficients of all possible magnitudes, the average changes of the first-order and the second-order statistics can be possibly minimized, which leads to less statistical detectability. The purpose of this paper is to refine the uniform embedding by considering the relative changes of statistical model for digital images, aiming to make the embedding modifications to be proportional to the coefficient of variation. Such a new strategy can be regarded as generalized uniform embedding in substantial sense. Compared with the original uniform embedding distortion (UED), the proposed method uses all the DCT coefficients (including the DC, zero, and non-zero AC coefficients) as the cover elements. We call the corresponding distortion function uniform embedding revisited distortion (UERD), which incorporates the complexities of both the DCT block and the DCT mode of each DCT coefficient (i.e., selection channel), and can be directly derived from the DCT domain. The effectiveness of the proposed scheme is verified with the evidence obtained from the exhaustive experiments using a popular steganalyzer with rich models on the BOSSbase database. The proposed UERD gains a significant performance improvement in terms of secure embedding capacity when compared with the original UED, and rivals the current state-of-the-art with much reduced computational complexity.
机译:统一嵌入于2012年首次针对非侧面信息JPEG隐写术引入,然后在2014年扩展至侧面信息JPEG隐写术。统一嵌入的思想是,通过将嵌入修改均匀地扩展到量化的离散余弦变换( DCT)系数的所有可能量值,一阶和二阶统计量的平均变化可能会最小化,从而导致统计可检测性降低。本文的目的是通过考虑数字图像统计模型的相对变化来改进均匀嵌入,以使嵌入修改与变异系数成比例。从实质意义上讲,这种新策略可以被视为广义统一嵌入。与原始均匀嵌入失真(UED)相比,该方法将所有DCT系数(包括DC,零和非零AC系数)用作覆盖元素。我们将相应的失真函数称为均匀嵌入重造失真(UERD),它结合了DCT块和每个DCT系数(即选择通道)的DCT模式的复杂性,并且可以直接从DCT域中得出。使用流行的隐写分析器,在BOSSbase数据库上使用具有丰富模型的穷举实验,从详尽的实验中获得的证据验证了所提方案的有效性。与原始UED相比,拟议的UERD在安全嵌入能力方面获得了显着的性能提升,并以大大降低的计算复杂性与当前的最新技术相抗衡。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号