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Characterization of Long-Term Stability of Suomi NPP Cross-Track Infrared Sounder Spectral Calibration

机译:Suomi NPP跨轨红外测深仪光谱校准的长期稳定性表征

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Since early 2012, the cross-track infrared sounder (CrIS) onboard the Suomi National Polar-Orbiting Partnership satellite has continually provided the hyperspectral infrared observations for profiling atmospheric temperature, moisture, and greenhouse gases. The CrIS radiance data are also directly assimilated into global numerical weather prediction models to improve the medium-range forecasts. These important applications require accurate CrIS calibration. Since CrIS radiometric accuracy depends on the accurate spectral calibration, it is important to reduce the spectral uncertainty and increase the calibration stability for weather and climate applications. In this paper, the accuracy of CrIS spectral calibration and its stability are assessed using the operational sensor data record (SDR) data generated by the interface data processing segment (IDPS). A spectral validation method is developed and applied to clear scene data over ocean from September 22, 2012, to April 19, 2016. It is shown that CrIS metrology laser wavelength varies within 3 ppm, as measured by the Neon calibration subsystem. While the current CrIS operational algorithm is designed to have a spectra error less than 2 ppm, the actual spectral errors are about 4 ppm due to the IDPS software bugs. A new correction method is applied to fix the bugs and to further improve CrIS spectral calibration. It is found that the CrIS spectral calibration accuracy is less than 1 ppm in both normal and full spectral resolution SDR data sets.
机译:自2012年初以来,Suomi国家极地轨道合作伙伴卫星上的跨轨红外测深仪(CrIS)不断提供高光谱红外观测资料,用于分析大气温度,湿度和温室气体。 CrIS辐射数据也被直接吸收到全球数值天气预报模型中,以改善中程预报。这些重要的应用需要精确的CrIS校准。由于CrIS辐射测量的准确性取决于准确的光谱校准,因此对于天气和气候应用而言,减少光谱不确定性并提高校准稳定性非常重要。在本文中,使用界面数据处理段(IDPS)生成的操作传感器数据记录(SDR)数据评估CrIS光谱校准的准确性及其稳定性。开发了一种光谱验证方法,并将其应用于从2012年9月22日至2016年4月19日清除海洋上的场景数据。结果表明,通过Neon校准子系统测量,CrIS计量激光器的波长变化在3 ppm以内。尽管当前的CrIS操作算法被设计为具有小于2 ppm的光谱误差,但是由于IDPS软件错误,实际的光谱误差约为4 ppm。应用了一种新的校正方法来修复错误并进一步改善CrIS光谱校准。发现在正常和全光谱分辨率SDR数据集中,CrIS光谱校准精度均小于1 ppm。

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