Multiple fault detection using single fault test sets

摘要

A simulation study of the 74LS181 4-b ALU (arithmetic logic unit) using 16 complete single stuck-at fault test sets demonstrated significantly higher multiple stuck-at fault coverage than predicted by previous theoretical studies. Analysis of the undetected multiple faults shows the effect of circuit and test set characteristics on fault coverage. A fault masking property, defined as self-masking, is observed for the undetected faults in the simulation study. A heuristic is described for evaluating the multiple fault coverage of single stuck-at fault test sets. A second heuristic generates augmented test sets, providing improved multiple stuck-at fault coverage with a minimal increase in test set development cost.