Improving test effectiveness of scan-based BIST by scan chain partitioning

摘要

Test effectiveness of a test-per-scan built-in self-test (BIST) scheme is highly dependent on the length and number of scan chains. Fewer cycles are used to capture test responses when the length of the scan chains increases and the total number of clock cycles is fixed. Another important feature of the test-per-scan BIST scheme is that test responses of the circuit at the inputs of the scan flip-flops are not observable during the shift cycles. A new scan architecture is proposed to make a scan-based circuit more observable. The scan chain is partitioned into multiple segments. Multiple capture cycles are inserted to receive test responses during the shift cycles compared to the test-per-scan test scheme. Unlike other BIST schemes using multiple capture cycles after the shift cycles, our method inserts multiple capture cycles inside the shift cycles, but not after the shift cycles. Unlike the previous method that drives multiple scan segments by a single scan-in signal, the proposed method uses a new architecture to control all scan segments by different signals. Sufficient experimental results are presented to demonstrate the effectiveness of the method.