A SAT Based Test Generation Method for Delay Fault Testing of Macro Based Circuits

摘要

This letter addresses the problem of delay fault test generation in circuits using macros whose implementation is not known. The proposed approach uses a new signal representation that allows us to evaluate any kind of sensitization conditions (robust, non-robust, and functional) by means of Boolean differential calculus. Such an approach makes use of binary decision diagrams to support the computation of sensitization conditions for each macro along a path and of Boolean satisfiability to justify such conditions at primary inputs. Results are shown for a set of benchmarks.